Courses Detail Information

MSE6202J – Structural, Physical and Chemical Characterization of Materials


Instructors:

Qianli Chen;Yunlong Guo

Credits: 3 credits

Pre-requisites: Graduate standing or VK250

Description:

Study of the basic structural, physical and chemical characterization techniques that are commonly used in materials science and engineering. X-ray diffraction, a wide range of microscopies, spectroscopies, and scanning probe methods will be covered. Techniques will be presented in terms of the underlying physics and chemistry, and case studies.

Course Topics:

Light Microscopy

Fundamental Physics

X-ray Production, Crystallography

Diffraction

Transmission Electron Microscopy (TEM)

Scanning Electron Microscopy (SEM)

Scanning Probe Microscopy (STM & AFM)

Neutron Scattering

Thin Films

Electrical Properties

Optical Properties

Elemental Analysis

X-ray Photoelectron Spectroscopy (XPS)

Ultraviolet Photoelectron Spectroscopy (UPS)

Secondary Ion Mass Spectrometry (SIMS)

Nuclear Magnetic Resonance Spectroscopy (NMR)

Vibrational Spectroscopy (Infrared & Raman)

Thermal Analysis